Seminar in Chip Test and Debug
Seminars by industry professionals in digital IC manufacturing test and silicon debug. Topics include yield and binsplit modeling, defect types and detection, debug hardware, physical analysis, and design for test/debug circuits. Case studies of silicon failures.
Basic digital IC design (271 or 371).
Thank you for your interest. No sections are available. Please click the button below to receive an email when the course becomes available again.